Handbook of Surface and Interface Analysis

  • Producent: Taylor
  • Oprawa: Twarda
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Opis: Handbook of Surface and Interface Analysis - John C. Riviere

The "Handbook of Surface and Interface Analysis: Methods for Problem-Solving" describes the physical basis and technical implementation of the most commonly used techniques for materials characterization. Providing an overview of the benefits and limitations for each methodology, this second edition features five brand new chapters that address surface and interface analysis by HRTEM and XTEM, synchrotron-based techniques, scanning tunneling microscopy, biocompatible materials, and nano-structured materials. This volume combines the expertise from a distinguished group of scientists into a comprehensive, integrated source of information on the characterization methods considered crucial in this field. This handbook on surface and interface analysis can help to create that knowledgeable person ! sufficient in-depth technical information to satisfy those who want to know the details ! Material scientists, engineers, materials researchers, or anyone who needs information about a material obtained using surface analysis methods will find this handbook an excellent resource for determining the best approach and the right techniques to use. --IEEE Electrical Insulation Magazine, Vol. 26, No. 3, May-June 2010Introduction, J. C. Riviere and S. Myhra Problem Solving: Strategy, Tactics, and Resources, S. Myhra and J. C. Riviere Photoelectron Spectroscopy (XPS and UPS), Auger Electron Spectroscopy (AES), and Ion Scattering Spectroscopy (ISS), V. Y. Young and G. B. Hoflund Ion Beam Techniques: Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS), B. Hagenhoff, R. Kersting, and D. Rading Surface and Interface Analysis by Scanning Probe Microscopy, S. Myhra Transmission Electron Microscopy: Instrumentation, Imaging Modes, and Analytical Attachments J. M. Titchmarsh Synchrotron-Based Techniques, A. R. Gerson, D. J. Cookson, and K. C. Prince Quantifi cation of Surface and Near-Surface Composition by AES and XPS, S. Tougaard Structural and Analytical Methods for Surfaces and Interfaces: Transmission Electron Microscopy, J. M. Titchmarsh In-Depth Analysis/Profiling, F. Reniers and C. R. Tewell Characterization of Nanostructured Materials, M. Werner, A. Crossley, and C. Johnston Problem-Solving Methods in Tribology with Surface-Specifi c Techniques, C. Donnet and J.-M. Martin Problem-Solving Methods in Surface Analysis Metallurgy, R. K. Wild Composites, P. M. A. Sherwood Minerals, Ceramics, and Glasses, R. St. C. Smart and Z. Zhang Catalyst Characterization, W. E. S. Unger and T. Gross Surface Analysis of Biomaterials, M. Jasieniak, D. Graham, P. Kingshott, L. J. Gamble, and H. J. Griesser Adhesion Science and Technology, J. F. Watts Electron Spectroscopy in Corrosion Science, J. E. Castle


Szczegóły: Handbook of Surface and Interface Analysis - John C. Riviere

Tytuł: Handbook of Surface and Interface Analysis
Autor: John C. Riviere
Producent: Taylor
ISBN: 9780849375583
Rok produkcji: 2009
Ilość stron: 671
Oprawa: Twarda
Waga: 1.38 kg


Recenzje: Handbook of Surface and Interface Analysis - John C. Riviere

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Handbook of Surface and Interface Analysis

  • Producent: Taylor
  • Oprawa: Twarda

The "Handbook of Surface and Interface Analysis: Methods for Problem-Solving" describes the physical basis and technical implementation of the most commonly used techniques for materials characterization. Providing an overview of the benefits and limitations for each methodology, this second edition features five brand new chapters that address surface and interface analysis by HRTEM and XTEM, synchrotron-based techniques, scanning tunneling microscopy, biocompatible materials, and nano-structured materials. This volume combines the expertise from a distinguished group of scientists into a comprehensive, integrated source of information on the characterization methods considered crucial in this field. This handbook on surface and interface analysis can help to create that knowledgeable person ! sufficient in-depth technical information to satisfy those who want to know the details ! Material scientists, engineers, materials researchers, or anyone who needs information about a material obtained using surface analysis methods will find this handbook an excellent resource for determining the best approach and the right techniques to use. --IEEE Electrical Insulation Magazine, Vol. 26, No. 3, May-June 2010Introduction, J. C. Riviere and S. Myhra Problem Solving: Strategy, Tactics, and Resources, S. Myhra and J. C. Riviere Photoelectron Spectroscopy (XPS and UPS), Auger Electron Spectroscopy (AES), and Ion Scattering Spectroscopy (ISS), V. Y. Young and G. B. Hoflund Ion Beam Techniques: Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS), B. Hagenhoff, R. Kersting, and D. Rading Surface and Interface Analysis by Scanning Probe Microscopy, S. Myhra Transmission Electron Microscopy: Instrumentation, Imaging Modes, and Analytical Attachments J. M. Titchmarsh Synchrotron-Based Techniques, A. R. Gerson, D. J. Cookson, and K. C. Prince Quantifi cation of Surface and Near-Surface Composition by AES and XPS, S. Tougaard Structural and Analytical Methods for Surfaces and Interfaces: Transmission Electron Microscopy, J. M. Titchmarsh In-Depth Analysis/Profiling, F. Reniers and C. R. Tewell Characterization of Nanostructured Materials, M. Werner, A. Crossley, and C. Johnston Problem-Solving Methods in Tribology with Surface-Specifi c Techniques, C. Donnet and J.-M. Martin Problem-Solving Methods in Surface Analysis Metallurgy, R. K. Wild Composites, P. M. A. Sherwood Minerals, Ceramics, and Glasses, R. St. C. Smart and Z. Zhang Catalyst Characterization, W. E. S. Unger and T. Gross Surface Analysis of Biomaterials, M. Jasieniak, D. Graham, P. Kingshott, L. J. Gamble, and H. J. Griesser Adhesion Science and Technology, J. F. Watts Electron Spectroscopy in Corrosion Science, J. E. Castle

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Cena 647,90 PLN
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Szczegóły: Handbook of Surface and Interface Analysis - John C. Riviere

Tytuł: Handbook of Surface and Interface Analysis
Autor: John C. Riviere
Producent: Taylor
ISBN: 9780849375583
Rok produkcji: 2009
Ilość stron: 671
Oprawa: Twarda
Waga: 1.38 kg


Recenzje: Handbook of Surface and Interface Analysis - John C. Riviere

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