Fringe Pattern Analysis for Optical Metrology

  • Producent: VCH
  • Oprawa: Twarda
Wysyłka: Niedostępna
Sugerowana cena detaliczna 581,00 PLN
Nasza cena: 543,23 PLN
Oszczędzasz 6%
Dodaj do Schowka
Zaloguj się
Przypomnij hasło
×
×
Paypo
Oferujemy szeroki asortyment - ponad 120 tys. produktów
Dysponujemy solidną wiedzą - działamy już 11 lat
Dbamy o wybór najcenniejszych tytułów

Opis: Fringe Pattern Analysis for Optical Metrology

The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such as spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc.Chapter 1 Digital Linear Systems §1.1 Introduction§1.2 Digital Sampling §1.3 Linear time-invariant (LTI) systems §1.4 Z-transform analysis of digital linear systems §1.5 Fourier analysis of digital linear systems§1.6 Convolution one-dimensional digital filters§1.7 Convolution two-dimensional linear filters§1.8 Linear regularized filtering techniques§1.9 Stochastic processes§1.10 Linear quadrature filters§Chapter 2 Synchronous Temporal Interferometry§2.1 Introduction§2.2 The temporal carrier interferometric signal§2.3 Quadrature linear filters for phase estimation§2.4 The minimum 3-step PSA§2.5 Least-squares PSAs§2.6 Detuning in temporal interferometry§2.7 Noise in temporal interferometry§2.8 Harmonics in temporal interferometry §2.9 Quadrature filters design by 1st-order building blocks§2.10 Some further topics in linear PSAs theory§Chapter 3 Asynchronous Temporal Interferometry §3.1 Introduction§3.2 Spectral analysis of the Carré algorithm§3.3 Spectral analysis of other self-tunable PSAs §3.4 Self-calibrating PSAs §Chapter 4 Spatial Methods with Carrier §4.1 Introduction§4.2 Linear spatial carrier §4.3 Circular spatial carrier interferogram§4.4 2D Pixelated Spatial Carrier §4.5 Regularized Quadrature Filters§4.6 Relation Between Temporal and Spatial Analysis§Chapter 5 Spatial Methods without Carrier §5.1 Introduction §5.2 Phase demodulation of closed-fringe interferograms§5.3 The Regularized Phase Tracker (RPT)§5.4 Local Robust Quadrature Filters 231§5.5 2D Fringe Direction§5.6 2D Vortex Filter§5.7 The General Quadrature Transform§Chapter 6 Phase Unwrapping §6.1 Introduction§6.2 Phase unwrapping with by 1D line integration§6.3 Phase unwrapping with 1D IIR filters§6.4 1D phase unwrapping with linear prediction§6.5 2D phase unwrapping with linear prediction §6.6 Least-squares method for phase unwrapping§6.7 Phase unwrapping through demodulation using a phase tracker§6.8 Smooth unwrapping with 2D detection of phase inconsistencies§6.9 Quality Maps and Branch Cut Methods§Appendix§List of linear phase-shifting algorithms (PSAs)


Szczegóły: Fringe Pattern Analysis for Optical Metrology

Tytuł: Fringe Pattern Analysis for Optical Metrology
Producent: VCH
ISBN: 9783527411528
Rok produkcji: 2014
Ilość stron: 344
Oprawa: Twarda
Waga: 0.9 kg


Recenzje: Fringe Pattern Analysis for Optical Metrology

Zaloguj się
Przypomnij hasło
×
×

Fringe Pattern Analysis for Optical Metrology

  • Producent: VCH
  • Oprawa: Twarda

The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such as spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc.Chapter 1 Digital Linear Systems §1.1 Introduction§1.2 Digital Sampling §1.3 Linear time-invariant (LTI) systems §1.4 Z-transform analysis of digital linear systems §1.5 Fourier analysis of digital linear systems§1.6 Convolution one-dimensional digital filters§1.7 Convolution two-dimensional linear filters§1.8 Linear regularized filtering techniques§1.9 Stochastic processes§1.10 Linear quadrature filters§Chapter 2 Synchronous Temporal Interferometry§2.1 Introduction§2.2 The temporal carrier interferometric signal§2.3 Quadrature linear filters for phase estimation§2.4 The minimum 3-step PSA§2.5 Least-squares PSAs§2.6 Detuning in temporal interferometry§2.7 Noise in temporal interferometry§2.8 Harmonics in temporal interferometry §2.9 Quadrature filters design by 1st-order building blocks§2.10 Some further topics in linear PSAs theory§Chapter 3 Asynchronous Temporal Interferometry §3.1 Introduction§3.2 Spectral analysis of the Carré algorithm§3.3 Spectral analysis of other self-tunable PSAs §3.4 Self-calibrating PSAs §Chapter 4 Spatial Methods with Carrier §4.1 Introduction§4.2 Linear spatial carrier §4.3 Circular spatial carrier interferogram§4.4 2D Pixelated Spatial Carrier §4.5 Regularized Quadrature Filters§4.6 Relation Between Temporal and Spatial Analysis§Chapter 5 Spatial Methods without Carrier §5.1 Introduction §5.2 Phase demodulation of closed-fringe interferograms§5.3 The Regularized Phase Tracker (RPT)§5.4 Local Robust Quadrature Filters 231§5.5 2D Fringe Direction§5.6 2D Vortex Filter§5.7 The General Quadrature Transform§Chapter 6 Phase Unwrapping §6.1 Introduction§6.2 Phase unwrapping with by 1D line integration§6.3 Phase unwrapping with 1D IIR filters§6.4 1D phase unwrapping with linear prediction§6.5 2D phase unwrapping with linear prediction §6.6 Least-squares method for phase unwrapping§6.7 Phase unwrapping through demodulation using a phase tracker§6.8 Smooth unwrapping with 2D detection of phase inconsistencies§6.9 Quality Maps and Branch Cut Methods§Appendix§List of linear phase-shifting algorithms (PSAs)

Powiadom o dostępności
Podaj swój e-mail a zostaniesz poinformowany jak tylko pozycja będzie dostępna.
×
Cena 581,00 PLN
Nasza cena 543,23 PLN
Oszczędzasz 6%
Wysyłka: Niedostępna
Dodaj do Schowka
Zaloguj się
Przypomnij hasło
×
×

Paypo
Zaloguj się
Przypomnij hasło
×
×
Dodane do koszyka
×