Ionizing Radiation Effects in Electronics

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Opis: Ionizing Radiation Effects in Electronics

Ionizing Radiation Effects in Electronics: From Memories to Imagers delivers comprehensive coverage of the effects of ionizing radiation on state-of-the-art semiconductor devices. The book also offers valuable insight into modern radiation-hardening techniques. The text begins by providing important background information on radiation effects, their underlying mechanisms, and the use of Monte Carlo techniques to simulate radiation transport and the effects of radiation on electronics. The book then: * Explains the effects of radiation on digital commercial devices, including microprocessors and volatile and nonvolatile memories-static random-access memories (SRAMs), dynamic random-access memories (DRAMs), and Flash memories * Examines issues like soft errors, total dose, and displacement damage, together with hardening-by-design solutions for digital circuits, field-programmable gate arrays (FPGAs), and mixed-analog circuits * Explores the effects of radiation on fiber optics and imager devices such as complementary metal-oxide-semiconductor (CMOS) sensors and charge-coupled devices (CCDs) Featuring real-world examples, case studies, extensive references, and contributions from leading experts in industry and academia, Ionizing Radiation Effects in Electronics: From Memories to Imagers is suitable both for newcomers who want to become familiar with radiation effects and for radiation experts who are looking for more advanced material or to make effective use of beam time. "... timely and useful. The organization of this book is excellent, covering the most popular works in the field of radiation effects. The authors for these topics are famous, qualified, and professional at the relative field. All of them have devoted many years on their specific topics." -Lili Ding, Northwest Institute of Nuclear Technology, Xi'an, ChinaIntroduction to the Effects of Radiation on Electronic Devices Simone Gerardin and Marta Bagatin Monte Carlo Simulation of Radiation Effects Melanie Raine A Complete Guide to Multiple Upsets in SRAMs Processed in Decananometric CMOS Technologies Gilles Gasiot and Philippe Roche Radiation Effects in DRAMs Martin Herrmann Radiation Effects in Flash Memories Marta Bagatin and Simone Gerardin Microprocessor Radiation Effects Steven M. Guertin and Lawrence T. Clark Soft-Error Hardened Latch and Flip-Flop Design Lawrence T. Clark Assuring Robust Triple-Modular Redundancy Protected Circuits in SRAM-Based FPGAs Heather M. Quinn, Keith S. Morgan, Paul S. Graham, James B. Krone, Michael P. Caffrey, Kevin Lundgreen, Brian Pratt, David Lee, Gary M. Swift, and Michael J. Wirthlin Single-Event Mitigation Techniques for Analog and Mixed-Signal Circuits T. Daniel Loveless and W. Timothy Holman CMOS Monolithic Sensors with Hybrid Pixel-Like, Time-Invariant Front-End Electronics: TID Effects and Bulk Damage Study Lodovico Ratti, Luigi Gaioni, Massimo Manghisoni, Valerio Re, Gianluca Traversi, Stefano Bettarini, Francesco Forti, Fabio Morsani, Giuliana Rizzo, Luciano Bosisio, and Irina Rashevskaya Radiation Effects on CMOS Active Pixel Image Sensors Vincent Goiffon Natural Radiation Effects in CCD Devices Tarek Saad Saoud, Soilihi Moindjie, Daniela Munteanu, and Jean-Luc Autran Radiation Effects on Optical Fibers and Fiber-Based Sensors Sylvain Girard, Aziz Boukenter, Youcef Ouerdane, Nicolas Richard, Claude Marcandella, Philippe Paillet, Layla Martin-Samos, and Luigi Giacomazzi


Szczegóły: Ionizing Radiation Effects in Electronics

Tytuł: Ionizing Radiation Effects in Electronics
Producent: Productivity Press Inc
ISBN: 9781498722605
Rok produkcji: 2015
Ilość stron: 412
Oprawa: Twarda
Waga: 0.74 kg


Recenzje: Ionizing Radiation Effects in Electronics

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Ionizing Radiation Effects in Electronics

Ionizing Radiation Effects in Electronics: From Memories to Imagers delivers comprehensive coverage of the effects of ionizing radiation on state-of-the-art semiconductor devices. The book also offers valuable insight into modern radiation-hardening techniques. The text begins by providing important background information on radiation effects, their underlying mechanisms, and the use of Monte Carlo techniques to simulate radiation transport and the effects of radiation on electronics. The book then: * Explains the effects of radiation on digital commercial devices, including microprocessors and volatile and nonvolatile memories-static random-access memories (SRAMs), dynamic random-access memories (DRAMs), and Flash memories * Examines issues like soft errors, total dose, and displacement damage, together with hardening-by-design solutions for digital circuits, field-programmable gate arrays (FPGAs), and mixed-analog circuits * Explores the effects of radiation on fiber optics and imager devices such as complementary metal-oxide-semiconductor (CMOS) sensors and charge-coupled devices (CCDs) Featuring real-world examples, case studies, extensive references, and contributions from leading experts in industry and academia, Ionizing Radiation Effects in Electronics: From Memories to Imagers is suitable both for newcomers who want to become familiar with radiation effects and for radiation experts who are looking for more advanced material or to make effective use of beam time. "... timely and useful. The organization of this book is excellent, covering the most popular works in the field of radiation effects. The authors for these topics are famous, qualified, and professional at the relative field. All of them have devoted many years on their specific topics." -Lili Ding, Northwest Institute of Nuclear Technology, Xi'an, ChinaIntroduction to the Effects of Radiation on Electronic Devices Simone Gerardin and Marta Bagatin Monte Carlo Simulation of Radiation Effects Melanie Raine A Complete Guide to Multiple Upsets in SRAMs Processed in Decananometric CMOS Technologies Gilles Gasiot and Philippe Roche Radiation Effects in DRAMs Martin Herrmann Radiation Effects in Flash Memories Marta Bagatin and Simone Gerardin Microprocessor Radiation Effects Steven M. Guertin and Lawrence T. Clark Soft-Error Hardened Latch and Flip-Flop Design Lawrence T. Clark Assuring Robust Triple-Modular Redundancy Protected Circuits in SRAM-Based FPGAs Heather M. Quinn, Keith S. Morgan, Paul S. Graham, James B. Krone, Michael P. Caffrey, Kevin Lundgreen, Brian Pratt, David Lee, Gary M. Swift, and Michael J. Wirthlin Single-Event Mitigation Techniques for Analog and Mixed-Signal Circuits T. Daniel Loveless and W. Timothy Holman CMOS Monolithic Sensors with Hybrid Pixel-Like, Time-Invariant Front-End Electronics: TID Effects and Bulk Damage Study Lodovico Ratti, Luigi Gaioni, Massimo Manghisoni, Valerio Re, Gianluca Traversi, Stefano Bettarini, Francesco Forti, Fabio Morsani, Giuliana Rizzo, Luciano Bosisio, and Irina Rashevskaya Radiation Effects on CMOS Active Pixel Image Sensors Vincent Goiffon Natural Radiation Effects in CCD Devices Tarek Saad Saoud, Soilihi Moindjie, Daniela Munteanu, and Jean-Luc Autran Radiation Effects on Optical Fibers and Fiber-Based Sensors Sylvain Girard, Aziz Boukenter, Youcef Ouerdane, Nicolas Richard, Claude Marcandella, Philippe Paillet, Layla Martin-Samos, and Luigi Giacomazzi

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Cena 601,00 PLN
Nasza cena 561,93 PLN
Oszczędzasz 6%
Wysyłka: Niedostępna
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Szczegóły: Ionizing Radiation Effects in Electronics

Tytuł: Ionizing Radiation Effects in Electronics
Producent: Productivity Press Inc
ISBN: 9781498722605
Rok produkcji: 2015
Ilość stron: 412
Oprawa: Twarda
Waga: 0.74 kg


Recenzje: Ionizing Radiation Effects in Electronics

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